Site map | Imprint |
Product Overview
Flicker Noise System
EKV3
BSIMSOI3
HiSIM2.51
PSP
BSIM4
BSIM3v3
PSP Model Extraction Package


The first complete and commercially available extraction tool to support the latest version of the PSP 103.1 model.


The PSP Model Extraction Package

The new extraction package, for use with Agilent's Integrated Circuit Characterization and Analysis Program (IC-CAP) software, provides an easy-to-use interface for measurement collection, recommended extraction flow, and model implementation. This structure will allow CMOS modeling engineers to easily produce PSP models that will accurately and efficiently represent device process in the nanometer regime.

Using the PSP Model Extraction Package

You will find using the PSP Model Extraction Package to be a very intuitive process. The PSP specific interface takes you through a logical and efficient approach to achieving accurate CMOS models. By incorporating IC-CAP's graphical analysis interface, MultiPlot Studio, and custom GUIs; the modeling engineer becomes an integral part of the modeling process.

The package is segmented into two functional categories; one for measurement and one for extraction, making it possible to separate the two processes if necessary.

Package Features
The first is the unified measurement environment. This capability allows you to take device measurements once and use the same data for the PSP model and older models, such as the BSIM4, as long as the required data is a subset of the overall measurement data set.
The second is the implementation of a predefined extraction flow that is based on the foundry process data from the several large CMOS foundries. If your extraction is slightly different than the predefined flow, the extraction package has the flexibility for the modeler to make modifications to fit your particular process.

Ordering information from Agilent Technologies

PSP Model Extraction Package







The PSP Model Extraction Package (Agilent W8550EP)





Extraction flow

Extraction flow with local and global extraction steps.





Local extraction

Extraction of local PSP parameters





Global scaling

Scaling of global PSP parameters