Flicker Noise Modeling System
A complete industry proven solution for flicker noise measurement and parameter extraction.
Features at a glance:
 | Higly efficient measurements through intelligent control of the Low Noise Amplifier.
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| Supports the parameter extraction for a wide range of MOS, BJT, diode and resistor models.
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Measurement Module
It supports automatic measurements of all programmed DC operating points of one device through the intelligent adaption of LNA amplification. In addition, an expert measurement mode allows a full control of the LNA to perform any kind of measurements. Measurement results can be exported into IC-CAP .mdm or Excel format. A high quality 1Hz filter is available to support different input resistances.
Extraction Module
An intuitive user interface for both, extractions and measurements make this complex system easy to handle. The extractions support the following models: | MOS (PSP,BSIM3, BSIM4, BSIM3SOI,BSIM4SOI)
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| BJT (Spice GP)
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| Miscellaneous (Resistors andDiodes)
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The extractions takes into account different devices simultaneously to generate highly scalable models. The software is running under Agilent Technologies IC-CAP on Windows , Linux or Solaris.
Support and Services
AdMOS provides a full support in installing the Flicker Noise Modeling System including an intensive training in our lab.
Download detailed data sheet of the Flicker Noise Modeling System:
